Structural, Magnetic and Barrier Properties for Co-Ferrite Thin Films Fabricated by Plasma Oxidization

Effect of Cobalt Concentration on Structural and Magnetic Properties of Co-Fe Thin Films

Co-Fe films were electrodeposited on Cu substrate from electrolytes with different Co concentration  levels. X-ray diffraction (XRD) was used  to  investigate  the  films  crystal  structures. The  results  indicate that  if  the  Co  concentration  is  less  that  the  Fe  concentration,  the cubic  structure  appears  in  the  films, while  the  hexagonal  structure dominates when  the C...

effect of cobalt concentration on structural and magnetic properties of co-fe thin films

co-fe films were electrodeposited on cu substrate from electrolytes with different co concentration  levels. x-ray diffraction (xrd) was used  to  investigate  the  films  crystal  structures. the  results  indicate that  if  the  co  concentration  is  less  that  the  fe  concentration,  the cubic  structure  appears  in  the  films, while  the  hexagonal  structure dominates when  the co  co...

Influence of Co and Fe substitution on optical and structural properties of zinc oxide thin films

Zn0.97TM0.03O (TM = Co, Fe) thin films were deposited onto glass substrates by the sol–gel method and the effects of transition metals substitution on structural and optical properties of ZnO films were investigated. The X-ray diffraction patterns revealed that the films have wurtzite structure. Optical transmittance of the films was recorded in the range of 200 -800 nm wave length and the band...

Magnetic and structural properties of Mg–Co nanostructures fabricated

Structural, Electrical and Optical Properties of Molybdenum Oxide Thin Films Prepared by Post-annealing of Mo Thin Films

Molybdenum thin films with 50 and 150 nm thicknesses were deposited on silicon substrates, using DC magnetron sputtering system, then post-annealed at different temperatures (200, 325, 450, 575 and 700°C) with flow oxygen at 200 sccm (standard Cubic centimeter per minute). The crystallographic structure of the films was obtained by means of x-ray diffraction (XRD) analysis. An atomic force micr...